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Inventi Impact: X-Ray Optics & Instrumentation

Articles

  • Inventi:exoi/23776/17
    Polarization Characterization of Soft X-Ray Radiation at FERMI FEL-2
    01-Jan-1970 Research 2017 : October - December
    Eleonore Roussel, Enrico Allaria, Carlo Callegari, Marcello Coreno, Riccardo Cucini, Simone Di Mitri, Bruno Diviacco, Eugenio Ferrari, Paola Finetti, David Gauthier, Giuseppe Penco, Lorenzo Raimondi, Cristian Svetina, Marco Zangrando, Andreas Beckmann, Leif Glaser, Gregor Hartmann, Frank Scholz, Joern Seltmann, Ivan Shevchuk, Jens Viefhaus, Luca Giannessi

    The control of polarization state in soft and hard X-ray light is of crucial interest to\nprobe structural and symmetry properties of matter. Thanks to their Apple-II type undulators,\nthe FERMI-Free Electron Lasers are able to provide elliptical, circular or linearly polarized light\nwithin the extreme ultraviolet and soft X-ray range. In this paper, we report the characterization of\nthe polarization state of FERMI FEL-2 down to 5 nm. The results show a high degree of polarization\nof the FEL pulses, typically above 95%. The campaign of measurements was performed at the Low\nDensity Matter beamline using an electron Time-Of-Flight based polarimeter.

    How to Cite this Article
    CC Compliant Citation: Roussel, Eléonore, et al. \"Polarization Characterization of Soft X-Ray Radiation at FERMI FEL-2.\"\nPhotonics. Vol. 4. No. 2. Multidisciplinary Digital Publishing Institute, 2017, doi:10.3390/photonics4020029, http://\ncreativecommons.org/licenses/by/4.0/.
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